Low-energy electron microscopy

Low-energy electron microscopy, or LEEM, is an analytical surface science technique used to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films.^[1]

^ Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.

[Bauer1994-1] Bauer, E (1994). "Low energy electron microscopy". Reports on Progress in Physics. 57 (9): 895–938. Bibcode:1994RPPh...57..895B. doi:10.1088/0034-4885/57/9/002. ISSN 0034-4885. S2CID 250913078.

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