Atomic force microscopy

This article has multiple issues. Please help improve it or discuss these issues on the talk page. (Learn how and when to remove these template messages) This article needs additional citations for verification. Please help improve this article by adding citations to reliable sources. Unsourced material may be challenged and removed. Find sources: "Atomic force microscopy" – news · newspapers · books · scholar · JSTOR (August 2021) (Learn how and when to remove this message) This article may require cleanup to meet Wikipedia's quality standards. The specific problem is: Lots of text refers to images, some of which do not exist. Instead, images should support text (accessibility for visually impaired). Header MOS and other style cleanups needed too. Please help improve this article if you can. (August 2021) (Learn how and when to remove this message) (Learn how and when to remove this message)

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.